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国巨 CC0805JRNPO0BN101 贴片电容
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TEST TEST METHOD PROCEDURE REQUIREMENTS
Temperature
Characteristic
4.6 Capacitance shall be measured by the steps shown in the
following table.
The capacitance change should be measured after 5 min at
each specified temperature stage.
Step Temperature(℃)
a 25± 2
b Lower temperature± 3℃
c 25± 2
d Upper Temperature± 2℃
e 25± 2
(1) Class I
Temperature Coefficient shall be calculated from the
formula as below
Temp, Coefficient =
6
10
C1 x T
C2 - C1
Δ
[ppm/℃]
C1: Capacitance at step c
C2: Capacitance at 125℃
∆T: 100℃(=125℃-25℃)
(2) Class II
Capacitance Change shall be calculated from the formula
as below
∆C =
C1
C2 - C1
x 100%
C1: Capacitance at step c
C2: Capacitance at step b or d
<General purpose series>
Class1:
∆ C/C: ± 30ppm
Class2:
X7R: ∆ C/C: ± 15%
Y5V: ∆ C/C: 22~-82%
<High Capacitance series>
Class2:
X7R/X5R: ∆ C/C: ±15%
Y5V: ∆ C/C: 22~-82%
Adhesion 4.7 A force applied for 10 seconds to the line joining the
terminations and in a plane parallel to the substrate
Force
size ≥ 0603: 5N
size = 0402: 2.5N
size = 0201: 1N
Bending
Strength
IEC 60384-
21/22
4.8 Mounting in accordance with IEC 60384-22 paragraph 4.3 No visible damage
Conditions: bending 1 mm at a rate of 1 mm/s, radius jig
5 mm
Test Substrate:
100
40
b
C
a
4.5 YNSC147
Unit: mm
∆C/C
Class2:
<General purpose series>
X5R: ± 10%
<High Cap